Mueller Matrix Analysis for Light Interacting with Dense Particulate Films

Abstract: Mueller ellipsometric technique is a complete means of description of polarized light which is used for studying optical properties of materials. In this work, a method of Mueller matrix elements extraction and filtering from multiple polarization inputs was developed and applied to study disorder in dense particulate thin films. Films made of two different sorts of particles, namely spherical SiO2 and nanorod ZnO, were studied. It is found that order induced anisotropy is the most reliable indicator of particulate film quality. Severa figures of merit relying on Mueller matrix elements, ellipsometric parameters and degree of light polarization werde developed to quantify disorder in the particle positions and orientations on the film surface.